Characterizing Adhesion at the Small-Scale: AFM, Nanoindentation
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Characterizing Adhesion at the Small-Scale: AFM, Nanoindentation

7/18/2018
When: July 18, 2018
10:00 am
Where: Live Webinar
United States
Presenter: Kevin T. Turner, Ph.D. (University of Pennsylvania)
Contact: Connie Howe
(301) 986-9700 x104


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Webinar Time: July 18 2018; 10:00 AM - 11:00 AM ET (including Q&A)


Webinar Description:

Nanoindentation and atomic force microscopy (AFM) have become common tools in materials characterization laboratories. While nanoindentation is typically used to characterize mechanical properties, notably modulus and hardness, and AFM is often used to measure surface topography, both of these techniques, can also be used to characterize adhesion at the small scale. This webinar will discuss the how these two techniques can be used for adhesion characterization and show example measurements on several material systems. The webinar will also explain common adhesion mechanics models used to analyze data from AFM and nanoindentation measurements. Finally, the webinar will discuss challenges and limitations in using these techniques to characterize adhesion.

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